• DocumentCode
    2422832
  • Title

    Advanced semicustom design and fabrication at the Institute for Microelectronics Stuttgart

  • Author

    Beunder, M. ; Chen, G. ; Kernhof, J. ; Schau, M. ; Haas, W. ; Springer, R. ; Schwederski, T. ; Hoefflinger, B.

  • Author_Institution
    Inst. for Microelectron., Stuttgart, West Germany
  • fYear
    1989
  • fDate
    12-14 Jun 1989
  • Firstpage
    223
  • Lastpage
    228
  • Abstract
    The authors describe the development of the CMOS GATE FOREST design and fabrication environment. They discuss the advantages of a semicustom solution, the advanced design tools that are being developed, the fabrication process including the application of an electron beam direct write-on-wafer machine, and the subsequent test process. To highlight the capabilities and the use of the GATE FOREST, two industrial research projects and two student (master thesis) projects are discussed. The industrial projects have a complexity of more than 120 K active transistors and present state-of-the-art VLSI/ULSI design applications. The student projects, which cover a period of six to eight months, include the design, fabrication, and test of sample circuits
  • Keywords
    CMOS integrated circuits; VLSI; application specific integrated circuits; cellular arrays; circuit CAD; integrated circuit technology; integrated circuit testing; logic arrays; logic testing; ASIC; CAD; CMOS GATE FOREST; Institute for Microelectronics Stuttgart; ULSI; VLSI; computer aided design; electron beam direct write-on-wafer machine; fabrication process; semicustom design; test process; Circuit testing; Education; Educational institutions; Electron beams; Fabrication; Microelectronics; Spine; Transistors; Ultra large scale integration; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    University/Government/Industry Microelectronics Symposium, 1989. Proceedings., Eighth
  • Conference_Location
    Westborough, MA
  • ISSN
    0749-6877
  • Type

    conf

  • DOI
    10.1109/UGIM.1989.37340
  • Filename
    37340