• DocumentCode
    2423349
  • Title

    An algorithm of echo steganalysis based on power cepstrum and pattern classification

  • Author

    Zeng, Wei ; Ai, Haojun ; Hu, Ruimin

  • Author_Institution
    Nat. Eng. Res. Center for Multimedia Software, Wuhan Univ., Wuhan
  • fYear
    2008
  • fDate
    7-9 July 2008
  • Firstpage
    1344
  • Lastpage
    1348
  • Abstract
    Audio steganalysis has attracted more attentions recently. Echo steganalysis is one of the most challenging research fields. In this paper, an effective steganalysis method based on statistical moments of peak frequency is proposed. Combined with power cepstrum, it statistically analyzes the peak frequency using short window extracting, and then calculates the eight high order center moments of peak frequency as feature vector. The SVM classifier is utilized in classification. All of the 1200 audio signals are trained and tested in out extensive experiment work. With randomly selected 600 audio signals for training and remaining 600 audio signals for testing, and with various embedding parameters combinations such as hiding segment length, attenuation coefficient, echo delay for hiding, the proposed steganalysis algorithm can steadily achieve a correct classification rate of 85%. Experimental results and theoretical verification show that this method is an effective method of audio echo steganalysis.
  • Keywords
    audio coding; cepstral analysis; cryptography; data encapsulation; echo; feature extraction; pattern classification; statistical analysis; support vector machines; SVM classifier; audio coding; audio echo steganalysis algorithm; feature extraction; pattern classification; power cepstrum; short window extraction; statistical moment; Cepstrum; Degradation; Delay; Frequency; Pattern classification; Software algorithms; Steganography; Streaming media; Terrorism; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Audio, Language and Image Processing, 2008. ICALIP 2008. International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1723-0
  • Electronic_ISBN
    978-1-4244-1724-7
  • Type

    conf

  • DOI
    10.1109/ICALIP.2008.4590036
  • Filename
    4590036