• DocumentCode
    2423505
  • Title

    Field and lab aging of EP compound arresters

  • Author

    Sundararajan, R. ; Mohammed, A. ; Soundarajan, E. ; Graves, J.

  • Author_Institution
    Electron. & Comput. Eng. Technol. Dept., Arizona State Univ. East, Mesa, AZ, USA
  • fYear
    2003
  • fDate
    19-22 Oct. 2003
  • Firstpage
    426
  • Lastpage
    429
  • Abstract
    Organic polymers, such as EPDM, by virtue of their very nature are susceptible to aging and degradation (weathering) when used for high voltage outdoor insulator applications. The very same flexible bonds that offer the advantages of polymers also make them vulnerable to aging and degradation. This paper presents the aging and degradation of 10 kV and 18 kV EP polymeric arresters removed after 10 years and 5 years of service respectively in Florida (FL). There is severe chalking and discoloration and alligatoring on the 10 year arrester. FTIR analysis showed major loss of various chemical groups, such as CH2 and CH3 above 95% in the alligatored part and up to 70% in the nonalligatored part. Similar but lesser magnitude changes were seen in the 5 year aged arrester. SEM micrographs of the field aged samples showed deeper cracks in alligatored portion compared to non-alligatored portion. Similar results, but of relatively lesser magnitude, were observed in the laboratory aging of arresters for a similar period.
  • Keywords
    Fourier transform spectra; ageing; arresters; infrared spectra; polymer insulators; scanning electron microscopy; 10 kV; 18 kV; EP compound arresters; EPDM; FTIR analysis; SEM-micrographs; aging; alligatoring; chalking; degradation; discoloration; flexible bonds; high voltage outdoor insulator applications; organic polymers; weathering; Acoustical engineering; Aging; Arresters; Chemical analysis; Iron; Manufacturing; Plastic insulation; Polymers; Thermal degradation; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2003. Annual Report. Conference on
  • Print_ISBN
    0-7803-7910-1
  • Type

    conf

  • DOI
    10.1109/CEIDP.2003.1254884
  • Filename
    1254884