Three-dimensional microscopic and high frequency magnetic field measurement

Author

Shinada, H. ; Fukuhara, S. ; Seitou, S. ; Tohokoro, H. ; Omoto, S. ; Takano, H. ; Shiiki, K.

Author_Institution

Hitachi Ltd.

fYear

1990

fDate

17-20 April 1990

Keywords

Frequency; Magnetic field measurement; Magnetic force microscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 1990. Digests of INTERMAG '90. International

Conference_Location

Brighton, UK

Type

DOI

10.1109/INTMAG.1990.734769

Filename

734769

Link To Document