DocumentCode
2427093
Title
Fractal dimension analysis of audio signals for Indian musical instrument recognition
Author
Gunasekaran, S. ; Revathy, K.
Author_Institution
Design & Dev.-DSP, Tata Elxsi Ltd., Bangalore
fYear
2008
fDate
7-9 July 2008
Firstpage
257
Lastpage
261
Abstract
The application of fractal geometry to musical signals and instrumental recognition system is not been widely experimented. The fractal dimension D is a very important characteristic of fractals useful for segmentation. This paper introduces an instrument identification system, which uses fractal dimension for segmentation of audio signals. This research is organized in three parts. The first part of this research investigates fractal dimension based segmentation of musical sounds for feature extraction and recognition. The second part explores extraction of the feature set from the segmented musical signal. The feature set of the proposed system includes spectral, perceptual and temporal features of the musical signal. Third part of this research describes about the neural network classifiers. The system has been experimented with kNN classifier and multi-layer perceptron classifier and the performance of these were compared. The proposed system has been trained and tested with 10 different Indian musical instruments sound samples. The sample set contains solo and duet recordings. The system has shown overall recognition rate of 89.7% for solo and 82.8 % for duet.
Keywords
acoustic signal processing; audio signal processing; feature extraction; fractals; multilayer perceptrons; musical instruments; pattern classification; signal classification; Indian musical instrument recognition; audio signal segmentation; feature extraction; feature recognition; fractal dimension analysis; instrumental recognition system; multilayer perceptron classifier; musical signals; neural network classifiers; Acoustic testing; Feature extraction; Fractals; Geometry; Instruments; Multilayer perceptrons; Neural networks; Signal analysis; Signal processing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Audio, Language and Image Processing, 2008. ICALIP 2008. International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-1723-0
Electronic_ISBN
978-1-4244-1724-7
Type
conf
DOI
10.1109/ICALIP.2008.4590238
Filename
4590238
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