• DocumentCode
    2427788
  • Title

    Inductance aware interconnect scaling

  • Author

    Banerjee, Kaustav ; Mehrotra, Amit

  • Author_Institution
    Center for Integrated Syst., Stanford Univ., CA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    43
  • Lastpage
    47
  • Abstract
    This paper introduces a new global-tier interconnect scaling scheme which ensures that inductance effects do not start dominating the overall interconnect performance. It is shown that for unscaled global lines, inductance effects increase as technology scales while for the scaling scheme proposed by ITRS (1999), interconnects become extremely resistive and, while inductance effects diminish with scaling but the performance, specifically, delay per unit length, degrades with scaling. The effect of the proposed global interconnect scaling scheme on optimized driver size, interconnect length, delay per unit length and total buffer area is quantified and compared with the unscaled and the ITRS cases. It is shown that the proposed scaling scheme improves the delay per unit length without degrading inductive effects or increasing buffer area with scaling.
  • Keywords
    inductance; integrated circuit design; integrated circuit interconnections; ITRS scaling scheme; delay per unit length; global interconnect scaling scheme; global-tier interconnect scaling scheme; inductance aware interconnect scaling; inductance effects; interconnect length; interconnect performance; optimized driver size; resistive interconnects; technology scaling; total buffer area; unscaled global lines; Copper; Degradation; Delay effects; Impedance; Inductance; Integrated circuit interconnections; Mutual coupling; Parasitic capacitance; Repeaters; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2002. Proceedings. International Symposium on
  • Print_ISBN
    0-7695-1561-4
  • Type

    conf

  • DOI
    10.1109/ISQED.2002.996689
  • Filename
    996689