• DocumentCode
    2428584
  • Title

    On the use of windows for accurate analysis of package interconnects

  • Author

    Beyene, Wedernagegnehu T. ; Yuan, Chuck

  • Author_Institution
    Rambus Inc., Los Altos, CA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    181
  • Lastpage
    186
  • Abstract
    An accurate transient analysis of a package interconnect requires the modeling and analysis of conductor and dielectric losses, as well as other high-frequency effects of 3D structures. The skin effect and dispersion of interconnects are more accurately modeled in frequency domain. Consequently, the complete time-domain simulation of such a system is only possible using convolution techniques. Although the convolution method is well understood, the application of windowing for interconnect analysis is less so. In this paper, we present the practical considerations of window selection and its application to improve the accuracy of convolution simulators. We introduce the Tukey window and study the tradeoff between how smoothly a datum can be set to zero to avoid aliasing and suppress ripples and how much information tapering will discount at the edge of the window in order to obtain meaningful results. The bandlimiting effects of the Tukey window and other well-known windows are also compared. Finally, wirebond PBGA package and PCB-connector system are analyzed using the scattering parameters obtained from simulation and measurement, respectively, to verify the validity and accuracy of the method.
  • Keywords
    S-parameters; ball grid arrays; circuit analysis computing; convolution; integrated circuit interconnections; integrated circuit packaging; lead bonding; plastic packaging; time-domain analysis; transient analysis; 3D structures; PCB-connector system; Tukey window; aliasing; bandlimiting effects; conductor losses; convolution simulator accuracy; convolution techniques; dielectric losses; frequency domain modeling; high-frequency effects; information tapering; interconnect analysis; interconnect dispersion; package interconnect analysis; package interconnect modeling; plastic ball-grid-array; ripple suppression; scattering parameters; simulation; skin effect; time-domain simulation; transient analysis; window selection; windowing; windows; wirebond PBGA package; Conductors; Convolution; Dielectric losses; Dispersion; Frequency domain analysis; Packaging; Scattering parameters; Skin effect; Time domain analysis; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2002. Proceedings. International Symposium on
  • Print_ISBN
    0-7695-1561-4
  • Type

    conf

  • DOI
    10.1109/ISQED.2002.996726
  • Filename
    996726