DocumentCode
2430496
Title
A CMOS eddy current sensor for microsystems
Author
Gomez, Javier ; Esteve, Daniel ; Simonne, Jean
Author_Institution
Lab. for Anal. & Archit. of Syst., Toulouse, France
fYear
2000
fDate
2000
Abstract
This papers reports our contribution to the design of an eddy current sensor. The objective of this study is to conceive an Eddy current electromagnetic sensor in the area of the Nondestructive Testing. The sensor is integrated in a CMOS technology with an operational amplifier in the same substrate. A microsystem integrates the CMOS eddy current sensor that is used to detect cracks and irregularities of metallic targets to make a fast and reliable internal inspection
Keywords
CMOS integrated circuits; crack detection; eddy current testing; electric current measurement; microsensors; CMOS eddy current sensor; crack detection; electromagnetic microsystem; inspection; metallic target; nondestructive testing; operational amplifier; Bridge circuits; CMOS technology; Eddy currents; Inductors; Intelligent sensors; Microsensors; Operational amplifiers; Optical amplifiers; Optical sensors; Spirals;
fLanguage
English
Publisher
ieee
Conference_Titel
Devices, Circuits and Systems, 2000. Proceedings of the 2000 Third IEEE International Caracas Conference on
Conference_Location
Cancun
Print_ISBN
0-7803-5766-3
Type
conf
DOI
10.1109/ICCDCS.2000.869859
Filename
869859
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