DocumentCode
2432540
Title
Capacity and quality improvement in blind second generation watermarking
Author
El-Iskandarani, M.A. ; Darwish, S.M. ; Abubahia, A.M.
Author_Institution
Dept. of Environ. Studies, Univ. of Alexandria, Alexandria, Egypt
fYear
2009
fDate
5-8 Oct. 2009
Firstpage
139
Lastpage
143
Abstract
For digital image watermarking scheme, to be an effective tool for intellectual property protection, it must satisfy the requirements of image quality, watermark robustness and capacity, embedding security and extraction flexibility. Towards these requirements, this paper introduces a high-capacity second generation based blind watermarking scheme for protection of intellectual property, which takes the consideration of good image quality. In the proposed scheme, the host image is normalized by fast technique to resist geometric attacks and reduce the computational time. The normalized image is then transformed using parametric bi-orthogonal integer lifting wavelet transform (LWT) to increase security. The high-capacity watermark is embedded carefully into the salient features by utilizing least significant bits (LSBs) method to maximize the robustness and quality. Experimental results show the reliability of the proposed scheme against variety kinds of attacks including image processing attacks and geometric attacks.
Keywords
image coding; industrial property; watermarking; wavelet transforms; blind second generation watermarking; digital image watermarking scheme; geometric attacks; image processing attacks; image quality; intellectual property protection; least significant bit method; parametric biorthogonal integer lifting wavelet transform; Digital images; Image processing; Image quality; Intellectual property; Protection; Resists; Robustness; Security; Watermarking; Wavelet transforms; Fast normalization; High-capacity watermark; Image watermarking; Parametric lifting wavelet transform;
fLanguage
English
Publisher
ieee
Conference_Titel
Security Technology, 2009. 43rd Annual 2009 International Carnahan Conference on
Conference_Location
Zurich
Print_ISBN
978-1-4244-4169-3
Type
conf
DOI
10.1109/CCST.2009.5335552
Filename
5335552
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