• DocumentCode
    2433834
  • Title

    Transport analysis for polycrystalline silicon solar cells on glass substrates

  • Author

    Brendel, R. ; Bergmann, R.B. ; Fischer, B. ; Krinke, J. ; Plieninger, R. ; Rau, U. ; Reiß, D. ; Strunk, H.P. ; Wanka, H. ; Wernel, J.H.

  • Author_Institution
    Max-Planck-Inst. fur Festkorperforschung, Stuttgart, Germany
  • fYear
    1997
  • fDate
    29 Sep-3 Oct 1997
  • Firstpage
    635
  • Lastpage
    638
  • Abstract
    The authors fabricate polycrystalline silicon solar cells on glass by Si deposition on solid phase crystallized seed layers and derive an effective diffusion length Leff,QE=3 μm from quantum efficiency measurements. Three-dimensional transport modeling reveals that Leff,QE differs from the diffusion length Leff,IV in the diode saturation current jo=(q ni 2D)/(NA Leff,IV). Here q, ni, D, and NA denote the elementary charge, intrinsic carrier concentration, diffusion constant and doping concentration, respectively. However, the difference is small for their polycrystalline Si solar cells. Dominant recombination in the space charge region limits the open circuit voltage to 340 mV
  • Keywords
    carrier density; carrier lifetime; electron-hole recombination; elemental semiconductors; glass; semiconductor device models; semiconductor device testing; semiconductor doping; silicon; solar cells; space charge; substrates; 3 mum; 340 mV; Si; Si polycrystalline solar cells; deposition; diffusion constant; diode saturation current; dominant recombination; doping concentration; effective diffusion length; elementary charge; glass substrates; intrinsic carrier concentration; open circuit voltage; quantum efficiency measurements; solid phase crystallized seed layers; space charge region; three-dimensional transport modeling; transport analysis; Crystallization; Diodes; Doping; Glass; Length measurement; Phase measurement; Photovoltaic cells; Radiative recombination; Silicon; Solids;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3767-0
  • Type

    conf

  • DOI
    10.1109/PVSC.1997.654169
  • Filename
    654169