DocumentCode
2434038
Title
Combined Magnetic, Electric and Topographic Microscopy of Microfabricated Meter Lines-Quantification of MFM Force Response
Author
Gomez, R.D. ; Anderson, Alexander J. ; Mayergoyz, Isaak D.
Author_Institution
Univ. of Maryland
fYear
1998
fDate
6-9 Jan. 1998
Firstpage
15
Lastpage
15
Keywords
Calibration; Electrostatics; Force measurement; Frequency; Magnetic field measurement; Magnetic force microscopy; Magnetic moments; Phase estimation; Phase measurement; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-5118-5
Type
conf
DOI
10.1109/INTMAG.1998.735483
Filename
735483
Link To Document