• DocumentCode
    2434928
  • Title

    Progress toward technology transition of GaInP2/GaAs/Ge multijunction solar cells

  • Author

    Keener, Captain David N ; Marvin, Dean C. ; Brinker, David J. ; Curtis, Henry B. ; Price, P. Michael

  • Author_Institution
    Phillips Lab., Kirtland AFB, NM, USA
  • fYear
    1997
  • fDate
    29 Sep-3 Oct 1997
  • Firstpage
    787
  • Lastpage
    792
  • Abstract
    The objective of the joint WL/PL/NASA Multijunction Solar Cell Manufacturing Technology (ManTech) Program is to scale up high efficiency GaInP2/GaAs/Ge multijunction solar cells to production size, quantity, and yield while limiting the production cost/Watt ($/W) to 15% over GaAs cells. Progress made by the program contractors, Spectrolab and TECSTAR, include, respectively, best cell efficiencies of 25.76% and 24.7% and establishment of 24.2% and 23.8% lot average efficiency baseline designs. The paper also presents side-by-side testing results collected by Phillips Laboratory and NASA Lewis on Phase I deliverable cells, which shows compliance with program objectives. Cell performance, pre- and post-radiation, and temperature coefficient results on initial production GaInP2/GaAs/Ge solar cells are presented
  • Keywords
    III-V semiconductors; elemental semiconductors; gallium arsenide; gallium compounds; germanium; indium compounds; p-n heterojunctions; solar cells; space vehicle power plants; 23.8 to 25.76 percent; GaInP2-GaAs-Ge; GaInP2/GaAs/Ge multijunction solar cells; NASA Lewis; Phillips Laboratory; Spectrolab; TECSTAR; high efficiency solar cells; production cost/Watt limiting; production size scale up; solar cell performance; solar cell post-radiation results; solar cell pre-radiation results; technology transition; temperature coefficient; Costs; Gallium arsenide; Laboratories; Manufacturing; NASA; Photovoltaic cells; Production; Space technology; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3767-0
  • Type

    conf

  • DOI
    10.1109/PVSC.1997.654207
  • Filename
    654207