DocumentCode
2435056
Title
DEGRADATION OP OFF-STATE LEAKAGE IN PMOS TRANSISTORS UNDER HOT CARRIER INJECTION
Author
Huang, Charles H J ; Rost, Timothy A. ; McPherson, Joe W.
fYear
1994
fDate
16-19 Oct 1994
Firstpage
63
Keywords
Condition monitoring; Degradation; Electron traps; Hot carrier injection; Hot carriers; Leakage current; MOSFETs; Stress; Temperature dependence; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop, 1994. Final Report., 1994 International
Print_ISBN
0-7803-1908-7
Type
conf
DOI
10.1109/IRWS.1994.515828
Filename
515828
Link To Document