• DocumentCode
    2436027
  • Title

    Design and realisation of apparatus to study capillary discharge in gas

  • Author

    Young June Hong ; Phil Yong Oh ; Gi Chung Kwon ; Hee Myoung Shin ; Eun Ha Choi

  • Author_Institution
    PDP Res. Center, Kwangwoon Univ., Seoul
  • fYear
    2008
  • fDate
    15-19 June 2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. We have generated Xe plasma in dense plasma focus device of coaxial electrode for extreme ultraviolet lithography (EUVL) and investigated an emitted visible light for electro-optical plasma diagnostics. We have applied an input voltage 4.5 kV to the capacitor bank and the diode chamber have been filled with Xe gas of pressure 40 mTorr. The inner surface of cylindrical cathode have been attatched by an acrylic insulator. The electron temperature and density of the coaxial plasma focus were obtained by the optical emission spectroscopy (OES). The electron temperature has been measured by the two relative line intensity and Boltzmann plot. In case of electron density, it has been observed by the Stark broadening method. This experiment shows that the electron temperature and density characteristics for a focused plasma can be influenced by the acrylic insulator length installed onto the cathode surface and materials of anode. The EUV emission signal whose wavelength is about 6-16 nm has been detected by using a photo-detector (AXUV-100 Zr/C, IRD).
  • Keywords
    electron density; plasma density; plasma diagnostics; plasma focus; plasma temperature; ultraviolet lithography; Boltzmann plot; EUV emission; Stark broadening; acrylic insulator; capacitor bank; coaxial electrode; cylindrical cathode; dense plasma focus device; diode chamber; electro-optical plasma diagnostics; electron density; electron temperature; emitted visible light; extreme ultraviolet lithography; input voltage; optical emission spectroscopy; photo-detector; pressure 40 mtorr; voltage 4.5 kV; Cathodes; Coaxial components; Electrons; Optical surface waves; Plasma density; Plasma devices; Plasma diagnostics; Plasma measurements; Plasma temperature; Ultraviolet sources;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2008. ICOPS 2008. IEEE 35th International Conference on
  • Conference_Location
    Karlsruhe
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-1929-6
  • Electronic_ISBN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2008.4590706
  • Filename
    4590706