A new scale adaptive wavelet thresholding method for denoising using chi-square test statistic

Author

Das, A. ; Desai, U.B. ; Vaidya, P.P.

Author_Institution

Electron. Div., Bhabha Atomic Res. Centre, Bombay, India

Volume

3

fYear

2002

fDate

2002

Firstpage

859

Abstract

In this paper we develop a new scale adaptive scheme of wavelet thresholding for noise removal. The method uses chi-square test statistics (CTS) to discriminate between noise and signal among the wavelet coefficients. The scheme uses CTS as a ruler to measure the similarity between the statistical model and the true distribution of noise. The basic philosophy of the proposed method is similar to a recursive hypothesis testing procedure. We demonstrate this method by denoising signals corrupted with additive zero-mean Gaussian noise.

Keywords

Gaussian noise; adaptive signal processing; interference suppression; signal denoising; statistical analysis; wavelet transforms; CTS; additive zero-mean Gaussian noise; chi-square test statistic; denoising; noise/signal discrimination; recursive hypothesis testing procedure; scale adaptive wavelet thresholding method; statistical model; true noise distribution/model similarity; wavelet coefficients; Additive noise; Gaussian noise; Image denoising; Length measurement; Noise measurement; Noise reduction; Statistical analysis; Testing; Wavelet coefficients; Wavelet transforms;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Circuits and Systems, 2002. 9th International Conference on

Print_ISBN

0-7803-7596-3

Type

conf

DOI

10.1109/ICECS.2002.1046383

Filename

1046383