• DocumentCode
    2440889
  • Title

    Parallel I/O performance: From events to ensembles

  • Author

    Uselton, Andrew ; Howison, Mark ; Wright, Nicholas J. ; Skinner, David ; Keen, Noel ; Shalf, John ; Karavanic, Karen L. ; Olike, Leonid

  • Author_Institution
    CRD/NERSC, Lawrence Berkeley Nat. Lab., Berkeley, CA, USA
  • fYear
    2010
  • fDate
    19-23 April 2010
  • Firstpage
    1
  • Lastpage
    11
  • Abstract
    Parallel I/O is fast becoming a bottleneck to the research agendas of many users of extreme scale parallel computers. The principle cause of this is the concurrency explosion of high-end computation, coupled with the complexity of providing parallel file systems that perform reliably at such scales. More than just being a bottleneck, parallel I/O performance at scale is notoriously variable, being influenced by numerous factors inside and outside the application, thus making it extremely difficult to isolate cause and effect for performance events. In this paper, we propose a statistical approach to understanding I/O performance that moves from the analysis of performance events to the exploration of performance ensembles. Using this methodology, we examine two I/O-intensive scientific computations from cosmology and climate science, and demonstrate that our approach can identify application and middleware performance deficiencies - resulting in more than 4× run time improvement for both examined applications.
  • Keywords
    parallel processing; performance evaluation; extreme scale parallel computers; high-end computation; parallel I/O performance; parallel file systems; statistical approach; Concurrent computing; Explosions; File systems; High performance computing; Laboratories; Large-scale systems; Middleware; Monitoring; Performance analysis; Supercomputers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Parallel & Distributed Processing (IPDPS), 2010 IEEE International Symposium on
  • Conference_Location
    Atlanta, GA
  • ISSN
    1530-2075
  • Print_ISBN
    978-1-4244-6442-5
  • Type

    conf

  • DOI
    10.1109/IPDPS.2010.5470424
  • Filename
    5470424