• DocumentCode
    2443958
  • Title

    Dark current-voltage measurements on photovoltaic modules as a diagnostic or manufacturing tool

  • Author

    King, D.L. ; Hansen, B.R. ; Kratochvil, J.A. ; Quintana, M.A.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    1997
  • fDate
    29 Sep-3 Oct 1997
  • Firstpage
    1125
  • Lastpage
    1128
  • Abstract
    Dark current-voltage (dark I-V) measurements are commonly used to analyze the electrical characteristics of solar cells, providing an effective way to determine fundamental performance parameters without the need for a solar simulator. The dark I-V measurement procedure does not provide information regarding short-circuit current, but is more sensitive than light I-V measurements in determining the other parameters (series resistance, shunt resistance, diode factor and diode saturation currents) that dictate the electrical performance of a photovoltaic device. The work documented here extends the use of dark I-V measurements to photovoltaic modules, illustrates their use in diagnosing module performance losses and proposes their use for process monitoring during manufacturing
  • Keywords
    electric current measurement; semiconductor device testing; solar cell arrays; voltage measurement; dark I-V measurements; diagnostic tool; diode factor; diode saturation currents; electrical characteristics; fundamental performance parameters; manufacturing tool; module performance losses; photovoltaic modules; series resistance; shunt resistance; solar cells; Current measurement; Diodes; Electric resistance; Electric variables; Electric variables measurement; Electrical resistance measurement; Performance analysis; Photovoltaic cells; Photovoltaic systems; Solar power generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3767-0
  • Type

    conf

  • DOI
    10.1109/PVSC.1997.654286
  • Filename
    654286