• DocumentCode
    2444631
  • Title

    Two Post-Irradiation Temperature Techniques for Total Ionizing Dose

  • Author

    Campola, Michael J. ; Chen, Dakai ; LaBel, Kenneth A.

  • Author_Institution
    MEI Technol., Inc., Greenbelt, MD, USA
  • fYear
    2009
  • fDate
    20-24 July 2009
  • Firstpage
    152
  • Lastpage
    156
  • Abstract
    Data have been obtained using two methods that illustrate limitations of cold temperature storage to prevent annealing, and responses to post irradiation elevated temperature tests. Radiation testing was done using a Co60 Source.
  • Keywords
    aerospace instrumentation; annealing; radiation hardening (electronics); Co60 Source; annealing; cold temperature storage; space radiation environment; total ionizing dose; two-post-irradiation temperature techniques; Annealing; CMOS process; Guidelines; Ice; NASA; Performance evaluation; Temperature distribution; Temperature measurement; Testing; Time factors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2009 IEEE
  • Conference_Location
    Quebec City, QC
  • Print_ISBN
    978-1-4244-5092-3
  • Type

    conf

  • DOI
    10.1109/REDW.2009.5336296
  • Filename
    5336296
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2444631