• DocumentCode
    2445101
  • Title

    Enhanced oxygen adsorption activity by CuO catalyst clusters on SnO2 thin film based sensors

  • Author

    Chowdhuri, Arijit ; Haridas, Divya ; Sreenivas, K. ; Gupta, Vinay

  • Author_Institution
    Acharya Narendra Dev Coll., Univ. of Delhi, New Delhi
  • fYear
    2008
  • fDate
    Nov. 30 2008-Dec. 3 2008
  • Firstpage
    553
  • Lastpage
    556
  • Abstract
    Resistance characteristics of thin film sensors based on uncoated SnO2, SnO2 with CuO overlayer and SnO2 with CuO dotted clusters are compared in three different backgrounds of air, oxygen and vacuum. Measurements for the three sensor configurations are carried out as a function of temperature. The novel dispersal method of CuO catalyst in the form of dotted clusters is seen to enhance the oxygen adsorption activity on surface of SnO2 thin film sensors. Conversion of molecular oxygen (O2 -) to atomic oxygen (O-) is shown to reduce the concentration of charge carriers in the conduction band of SnO2 film. Co-existence of a greater amount of adsorbed oxygen on the SnO2 film surface in conjunction with modulation of the space-charge region at the CuO-SnO2 interface are attributed to influence the resistance of the sensor structures under reducing gas.
  • Keywords
    adsorption; catalysts; conduction bands; copper compounds; electrical resistivity; oxygen; semiconductor materials; semiconductor thin films; space charge; thin film sensors; tin compounds; O2; SnO2; SnO2-CuO; catalyst clusters; charge carriers; conduction band; film surface; oxygen adsorption activity; resistance characteristics; sensor configurations; space-charge; temperature function; thin film sensors; Charge carriers; Electrons; Gas detectors; Semiconductivity; Semiconductor thin films; Sensor phenomena and characterization; Sputtering; Surface resistance; Temperature sensors; Thin film sensors; Gas Sensor; adsorption; sputtering; thin films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensing Technology, 2008. ICST 2008. 3rd International Conference on
  • Conference_Location
    Tainan
  • Print_ISBN
    978-1-4244-2176-3
  • Electronic_ISBN
    978-1-4244-2177-0
  • Type

    conf

  • DOI
    10.1109/ICSENST.2008.4757167
  • Filename
    4757167