• DocumentCode
    2445899
  • Title

    Side reading study of recording heads

  • Author

    Su, J.L. ; Kochan Ju ; Lang Vo

  • Author_Institution
    Almaden Research Center
  • fYear
    1992
  • fDate
    13-16 April 1992
  • Firstpage
    255
  • Lastpage
    255
  • Keywords
    Degradation; Distortion measurement; Ferrites; Frequency domain analysis; Magnetic heads; Magnetoresistance; Noise reduction; Semiconductor thin films; Signal to noise ratio; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 1992. Digests of Intermag '92., International
  • Conference_Location
    St. Louis, MO, USA
  • Print_ISBN
    0-7803-0637-6
  • Type

    conf

  • DOI
    10.1109/INTMAG.1992.696438
  • Filename
    696438