DocumentCode
2446650
Title
TMR Window and Erase Band Measurements with thin Film Write/MR Read Heads on Metal Particle Tape
Author
McKinstry, K.D. ; Dee, R.H.
Author_Institution
Storage Technol. Corp.
fYear
1998
fDate
6-9 Jan. 1998
Firstpage
153
Lastpage
153
Keywords
Bit error rate; Coercive force; Magnetic heads; Magnetic noise; Magnetic recording; Particle measurements; Sequential analysis; Signal to noise ratio; Transistors; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-5118-5
Type
conf
DOI
10.1109/INTMAG.1998.737326
Filename
737326
Link To Document