DocumentCode
2446736
Title
Coverage Driven Test Generation Framework for RTL Functional Verification
Author
Guo, Yang ; Qu, Wanxia ; Li, Tun ; Li, Sikun
Author_Institution
Nat. Univ. of Defense Technol., Changsha
fYear
2007
fDate
15-18 Oct. 2007
Firstpage
321
Lastpage
326
Abstract
Functional verification is widely recognized as the bottleneck of the hardware design cycle. The coverage-driven verification approach makes coverage the core engine that drives the whole verification flow, which enables reaching high quality verification in a timely manner. In this paper, we present a coverage driven test generation methodology and a set of tools. We present a novel method for automatic generating simulation vectors from HDL descriptions based on path coverage and constraint solving. We present a novel approach to generate functional vectors based on assertions for RTL design verification. Our approach combines program-slicing based design extraction, word-level SAT and dynamic searching techniques. We also present a coverage analysis method based on VCD file, which only replaying the simulation of the control statements in the HDL description. Experimental results show the efficiency of our methodology.
Keywords
constraint handling; formal verification; hardware description languages; program slicing; HDL descriptions; RTL functional verification; automatic generating simulation vectors; constraint solving; hardware design; path coverage; program slicing; test generation; Algorithm design and analysis; Analytical models; Bayesian methods; Degradation; Engines; Genetic algorithms; Hardware design languages; Performance analysis; Testing; Time to market;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design and Computer Graphics, 2007 10th IEEE International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-1579-3
Electronic_ISBN
978-1-4244-1579-3
Type
conf
DOI
10.1109/CADCG.2007.4407902
Filename
4407902
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