DocumentCode
2447795
Title
Prototype for a large-scale static timing analyzer running on an IBM Blue Gene
Author
Holder, Akintayo ; Carothers, Christopher D. ; Kalafala, Kerim
Author_Institution
Comput. Sci. Dept., Rensselaer Polytech. Inst., Troy, NY, USA
fYear
2010
fDate
19-23 April 2010
Firstpage
1
Lastpage
8
Abstract
This paper focuses on parallelization of the classic static timing analysis (STA) algorithm for verifying timing characteristics of digital integrated circuits. Given ever-increasing circuit complexities, including the need to analyze circuits with billions of transistors, across potentially thousands of process corners, with accuracy tolerances down to the picosecond range, sequential execution of STA algorithms is quickly becoming a bottleneck to the overall chip design closure process. A message passing based parallel processing technique for performing STA leveraging an IBM Blue Gene/L supercomputing platform is presented. Results are collected for a small industrial 65 nm benchmarking design, where the algorithm demonstrates speedup of nearly 39 times on 64 processors and a peak of 119 times (without partitioning costs, speedup is 263 times) on 1024 processors. With an idealized synthetic circuit, the algorithm demonstrated 259 times speedup, 925 times speedup without partitioning overhead, on 1024 processors. To the best of our knowledge, this is the first result demonstrating scalable STA on the IBM Blue Gene.
Keywords
message passing; multiprocessing systems; parallel machines; timing; IBM Blue Gene/L supercomputing platform; large-scale static timing analyzer; message passing; parallel processing technique; Algorithm design and analysis; Chip scale packaging; Circuit analysis; Complexity theory; Digital integrated circuits; Large-scale systems; Message passing; Partitioning algorithms; Prototypes; Timing; parallel computing; static timing analysis; supercomputing;
fLanguage
English
Publisher
ieee
Conference_Titel
Parallel & Distributed Processing, Workshops and Phd Forum (IPDPSW), 2010 IEEE International Symposium on
Conference_Location
Atlanta, GA
Print_ISBN
978-1-4244-6533-0
Type
conf
DOI
10.1109/IPDPSW.2010.5470757
Filename
5470757
Link To Document