• DocumentCode
    2449408
  • Title

    Offset calibrating comparator array for 1.2-V, 6bit, 4-Gsample/s flash ADCs using 0.13/spl mu/m generic CMOS technology

  • Author

    Okada, Hiroyuki ; Hashimoto, Yasuyuki ; Sakata, Kohji ; Tsukada, Toshiro ; Ishibashi, Koichiro

  • Author_Institution
    STARC, Yokohama, Japan
  • fYear
    2003
  • fDate
    16-18 Sept. 2003
  • Firstpage
    711
  • Lastpage
    714
  • Abstract
    A 1.2-V calibration comparator array for a flash-type ADC has been developed using 0.13/spl mu/m generic CMOS technology. The developed offset calibration technique corrects the offset mismatch better than 6bit resolution. By employing an offset calibration circuit in the comparator array, the comparator array can operate at low supply voltages. To evaluate the comparator array, a-bit flash-type ADC was fabricated that occupies 0.198 mm /sup 2/. With a 1.2-V power supply, it achieves 4.0 GSample/s and consumes 182 mW.
  • Keywords
    CMOS logic circuits; analogue-digital conversion; calibration; comparators (circuits); integrated circuit design; 0.13 micron; 1.2 V; 182 mW; CMOS technology; comparator array; flash-type ADC; offset calibration circuit; offset mismatch; Analog circuits; Analog-digital conversion; CMOS technology; Calibration; Digital circuits; Dynamic range; Logic arrays; Low voltage; Power supplies; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2003. ESSCIRC '03. Proceedings of the 29th European
  • Conference_Location
    Estoril, Portugal
  • Print_ISBN
    0-7803-7995-0
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2003.1257234
  • Filename
    1257234