Glamorous analog testability - we already test them and ship them... so what is the problem?

Summary form only given. In fact, contemporary analog test seems to represent a niche area for which solutions are always future ones. Yet, analog circuits are being mass-produced at astounding rates (whether within more complex digital IC\´s or as purely analog parts). This apparent paradox is addressed in this panel, which adopts a problem-solving approach to defining and addressing the analog test domain. It is the panel\´s position that the very definition of everything "analog" has shifted in recent years, and a significant dichotomy between test practitioners and chip manufacturers on the one hand and DFT-providers or researchers on the other exists. In this context, a typical question may be: is DFT or BIST really the answer, or should the research community focus more on test techniques? As it turns out, the industry is indeed going through a rapid change that is impacting everything from test engineers to test equipment and business models. This, coupled with little investment in the way of analog options in test equipment, is one of the many reasons there is a "problem" in analog testability.