DocumentCode
2452808
Title
Experimental analysis of the dynamic performance of Si, GaAs and SiC Diodes
Author
Blinov, A. ; Vinnikov, D. ; Rang, T.
Author_Institution
Dept. of Electr. Drives & Power Electron., TUT, Tallinn, Estonia
fYear
2012
fDate
3-5 Oct. 2012
Firstpage
49
Lastpage
52
Abstract
This paper presents original test results using GaAs and SiC based diode structures instead of Si based fast recovery diode structures to be applied in a new voltage fed step-up DC/DC converter. Overall test results show that the GaAs diodes behave similarly to fast recovery silicon diodes assuming equal operating and cooling conditions. As expected, SiC Schottky diode was found to show a clear advantage in terms of reverse-recovery characteristics. The positive temperature coefficient of the on-state voltage drop of GaAs and SiC diodes could provide significant application advantage in high-power applications, where the parallel connection of devices is necessary.
Keywords
DC-DC power convertors; III-V semiconductors; Schottky diodes; electric potential; elemental semiconductors; gallium arsenide; power semiconductor diodes; silicon; silicon compounds; wide band gap semiconductors; GaAs; Si; SiC; cooling condition; dynamic performance; experimental analysis; fast recovery Schottky diode structure; high-power application; on-state voltage drop; positive temperature coefficient; reverse-recovery characteristics; voltage fed step-up DC-DC converter; Gallium arsenide; Schottky diodes; Silicon; Silicon carbide; Switches; Topology;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Conference (BEC), 2012 13th Biennial Baltic
Conference_Location
Tallinn
ISSN
1736-3705
Print_ISBN
978-1-4673-2775-6
Type
conf
DOI
10.1109/BEC.2012.6376812
Filename
6376812
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