Delay-fault run-time XOR-less aging detection unit using BRAM in modern FPGAs

The reliability issue, including aging processes in modern devices with very fine structures and utilizing programmable technologies, being applied in high-performance or dependable systems in various safety, automotive or space applications, is sometimes very difficult to predict, measure or watch. The task is well-mastered in the world of ASIC, the situation is slightly different for FPGA devices. Modern FPGA devices incorporate number of true dual-port memory blocks with 8-T cells, hence offering new options. However, such blocks are typically used for data storage and processing purposes. This paper presents a new way of utilization of the RAM block (BRAM) for the delay fault detection purposes. The BRAM and a simple controller log risky transitions or delay fault events and may positively affect the overall reliability of the device as well as all the system.