DocumentCode
2458422
Title
Advanced on-wafer multiport calibration methods for mono- and mixed-mode device characterization
Author
Heuermann, Holger ; Rumiantsev, Andrej ; Schott, Steffen
fYear
2004
fDate
38149
Firstpage
91
Lastpage
96
Keywords
Calibration; Impedance; Measurement standards; Microwave communication; Microwave devices; Performance analysis; Radio frequency; Semiconductor device modeling; System testing; Transmission line theory;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest Spring, 2004. 63rd
Print_ISBN
0-7803-8371-0
Type
conf
DOI
10.1109/ARFTG.2004.1387861
Filename
1387861
Link To Document