DocumentCode
2462825
Title
A new piezoelectric tube scanner for simultaneous sensing and actuation
Author
Moheimani, S. O Reza ; Yong, Yuen K.
Author_Institution
Sch. of Electr. Eng. & Comput. Sci., Univ. of Newcastle, Newcastle, NSW, Australia
fYear
2009
fDate
10-12 June 2009
Firstpage
2249
Lastpage
2253
Abstract
Piezoelectric tubes with quartered external electrodes have been widely used as scanners in modern scanning probe microscopes. Various feedback control techniques have been developed to improve bandwidth and accuracy of these scanners. Non-contact displacement sensors, e.g. capacitive and inductive sensors, have been used for position feedback. However, their measurements contain a significant noise component if operated over large bandwidths. As an alternative measure of displacement, the piezoelectric voltage induced in a tube nanopositioner has been proposed recently. This technique provides a much improved noise figure, up to three orders of magnitude better than capacitive sensors. In this arrangement, an electrode is used to actuate the tube, while the opposite electrode is used as a sensor. Operating the tube in this mode has two drawbacks: i) the operating range of the tube is reduced to half, and ii) the tube is driven asymmetrically, thus the opposite sides of the tube are no longer stressed antisymmetrically, i.e. the tube cannot be considered as a perfectly collocated system. In this paper, a new electrode pattern for piezoelectric tube scanners is presented. This new approach addresses the aforementioned problems and allows simultaneous sensing and actuation of the tube in an efficient way.
Keywords
displacement control; feedback; nanopositioning; physical instrumentation control; piezoelectric actuators; scanning probe microscopy; feedback control techniques; noncontact displacement sensors; piezoelectric tube scanner; position feedback; quartered external electrodes; scanning probe microscopes; simultaneous actuation; simultaneous sensing; tube nanopositioner; Bandwidth; Capacitive sensors; Displacement measurement; Electrodes; Feedback control; Microscopy; Nanopositioning; Noise measurement; Probes; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 2009. ACC '09.
Conference_Location
St. Louis, MO
ISSN
0743-1619
Print_ISBN
978-1-4244-4523-3
Electronic_ISBN
0743-1619
Type
conf
DOI
10.1109/ACC.2009.5160032
Filename
5160032
Link To Document