• DocumentCode
    2464001
  • Title

    Substrate and process effects on thin Cr underlayer films

  • Author

    Youping Deng ; Lambeth, D.N. ; Laughlin, D.E.

  • Author_Institution
    Carnegie Mellon University
  • fYear
    1992
  • fDate
    13-16 April 1992
  • Firstpage
    405
  • Lastpage
    405
  • Keywords
    Chromium; Coercive force; Glass; Grain size; Optical films; Semiconductor films; Sputtering; Substrates; Voltage; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 1992. Digests of Intermag '92., International
  • Conference_Location
    St. Louis, MO, USA
  • Print_ISBN
    0-7803-0637-6
  • Type

    conf

  • DOI
    10.1109/INTMAG.1992.696588
  • Filename
    696588