Enhanced Broadband Parametric Wavelength Conversion in Silicon Waveguide With the Multi-Period Grating

Author

Xianting Zhang ; Jinhui Yuan ; Jiaxiu Zou ; Boyuan Jin ; Xinzhu Sang ; Qiang Wu ; Chongxiu Yu ; Farrell, Gerald

Author_Institution

State Key Lab. of Inf. Photonics & Opt. Commun., Beijing Univ. of Posts & Telecommun., Beijing, China

Volume

6

Issue

6

fYear

2014

fDate

Dec. 2014

Firstpage

1

Lastpage

14

Abstract

In this paper, a novel silicon-on-insulator (SOI) waveguide with the multi-period vertical grating is proposed to realize broadband parametric wavelength conversion with a quasi-phase matching technique. The grating period in the former part of the SOI waveguide is optimized to enhance the conversion efficiency at designated signal wavelength and the 3-dB bandwidth. When the continuous-wave pump at 1550 nm is used, the conversion efficiency of -14.0 dB at 1750 nm and the 3-dB bandwidth of 387 nm can be obtained. Compared to the constant-width waveguide, the improvements of 26.7 dB and 298 nm are achieved, respectively. The results show that this SOI waveguide is an ideal device for broadband wavelength conversion without dispersion engineering.

Keywords

diffraction gratings; elemental semiconductors; integrated optics; optical phase matching; optical pumping; optical waveguides; optical wavelength conversion; silicon; silicon-on-insulator; SOI waveguide; Si; broadband wavelength conversion; continuous-wave pump; conversion efficiency; enhanced broadband parametric wavelength conversion; grating period; multiperiod grating; multiperiod vertical grating; quasiphase matching; silicon waveguide; silicon-on-insulator waveguide; wavelength 1750 nm; wavelength 298 nm to 17550 nm; Absorption; Dispersion; Gratings; Optical waveguides; Optical wavelength conversion; Silicon; Multi-period grating; Silicon-on-insulator (SOI); multi-period grating; quasi-phase matching (QPM); silicon-on-insulator (SOI); wavelength conversion;

fLanguage

English

Journal_Title

Photonics Journal, IEEE

Publisher

ieee

ISSN

1943-0655

Type

jour

DOI

10.1109/JPHOT.2014.2366150

Filename

6945346