DocumentCode
2465978
Title
Dielectric surface flashover in vacuum at 100 K
Author
Neuber, A. ; Butcher, M. ; Hatfield, L.L. ; Kristiansen, M. ; Krompholz, H.
Author_Institution
Dept. of Electr. Eng., Texas Tech. Univ., Lubbock, TX, USA
Volume
2
fYear
1998
fDate
17-21 Aug 1998
Firstpage
815
Abstract
Cryogenic components in high power electrical systems and in power electronics gain more and more importance. The behavior of insulators under cryogenic conditions, however, is virtually unknown. In a fast coaxial setup, a dielectric test sample and electrodes in a vacuum are cooled to less than 100 K and the flashover development process is characterized using fast electrical and optical diagnostics. Three consecutive development stages for flashover in self-breakdown mode with a gap distance of 0.5 cm can be distinguished: (1) a fast current rise to mA-amplitudes within several nanoseconds which is probably associated with field emission, followed by; (2) a slow current rise to ampere-amplitudes with a duration of several 10´s to 100´s of nanoseconds associated with secondary emission avalanche saturation; and (3) a transition to a rapid gaseous ionization above the sample caused by electron induced outgassing, leading to impedance-limited current amplitudes of several 100 A. The temperature dependence of these three stages is investigated for different materials. Phase (1) shows a higher final current at lower temperature, which is probably due to a higher initial velocity of the secondary electrons, the duration of phase (2) is a decreasing function of breakdown voltage and only slightly different for low and room temperature, which points to a weak temperature dependence of the outgassing process. Flashover potentials show a slight increase at lower temperature, in general
Keywords
cryogenic electronics; flashover; insulator testing; power electronics; vacuum breakdown; vacuum insulation; 0.5 cm; 100 K; Flashover potentials; breakdown voltage; cryogenic components; current rise; dielectric surface flashover; electron induced outgassing; field emission; flashover development process; high power electrical systems; impedance-limited current amplitude; insulator behaviour; insulator diagnostics; power electronics; rapid gaseous ionization; secondary emission avalanche saturation; temperature dependence; vacuum; Coaxial components; Cryogenics; Dielectrics and electrical insulation; Electrodes; Flashover; Power electronics; Temperature dependence; Temperature distribution; Testing; Vacuum systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Discharges and Electrical Insulation in Vacuum, 1998. Proceedings ISDEIV. XVIIIth International Symposium on
Conference_Location
Eindhoven
ISSN
1093-2941
Print_ISBN
0-7803-3953-3
Type
conf
DOI
10.1109/DEIV.1998.738898
Filename
738898
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