• DocumentCode
    2466149
  • Title

    Combining classifiers

  • Author

    Kittler, J. ; Hater, M. ; Duin, R.P.W.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Surrey Univ., Guildford, UK
  • Volume
    2
  • fYear
    1996
  • fDate
    25-29 Aug 1996
  • Firstpage
    897
  • Abstract
    We develop a common theoretical framework for combining classifiers which use distinct pattern representations and show that many existing schemes can be considered as special cases of compound classification where all the pattern representations are used jointly to make a decision. An experimental comparison of various classifier combination schemes demonstrates that the combination rule developed under the most restrictive assumptions-the sum rule-and its derivatives consistently outperform other classifier combinations schemes. A sensitivity analysis of the various schemes to estimation errors is carried out to show that this finding can be justified theoretically
  • Keywords
    pattern classification; classifier combination; compound classification; pattern representations; sensitivity analysis; sum rule; Decision making; Estimation error; Extraterrestrial measurements; Machinery; Pattern recognition; Physics; Sensitivity analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 1996., Proceedings of the 13th International Conference on
  • Conference_Location
    Vienna
  • ISSN
    1051-4651
  • Print_ISBN
    0-8186-7282-X
  • Type

    conf

  • DOI
    10.1109/ICPR.1996.547205
  • Filename
    547205