DocumentCode
2466149
Title
Combining classifiers
Author
Kittler, J. ; Hater, M. ; Duin, R.P.W.
Author_Institution
Dept. of Electron. & Electr. Eng., Surrey Univ., Guildford, UK
Volume
2
fYear
1996
fDate
25-29 Aug 1996
Firstpage
897
Abstract
We develop a common theoretical framework for combining classifiers which use distinct pattern representations and show that many existing schemes can be considered as special cases of compound classification where all the pattern representations are used jointly to make a decision. An experimental comparison of various classifier combination schemes demonstrates that the combination rule developed under the most restrictive assumptions-the sum rule-and its derivatives consistently outperform other classifier combinations schemes. A sensitivity analysis of the various schemes to estimation errors is carried out to show that this finding can be justified theoretically
Keywords
pattern classification; classifier combination; compound classification; pattern representations; sensitivity analysis; sum rule; Decision making; Estimation error; Extraterrestrial measurements; Machinery; Pattern recognition; Physics; Sensitivity analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 1996., Proceedings of the 13th International Conference on
Conference_Location
Vienna
ISSN
1051-4651
Print_ISBN
0-8186-7282-X
Type
conf
DOI
10.1109/ICPR.1996.547205
Filename
547205
Link To Document