• DocumentCode
    2466590
  • Title

    Nonlinear Model Decomposition for Fault Detection and Isolation System Design

  • Author

    Berdjag, Denis ; Christophe, Cyrille ; Cocquempot, Vincent

  • Author_Institution
    Polytech ´´Lille, Univ. des Sci. et Technol. de Lille, Villeneuve d´´Ascq
  • fYear
    2006
  • fDate
    13-15 Dec. 2006
  • Firstpage
    3321
  • Lastpage
    3326
  • Abstract
    Model-based fault detection and isolation methods relies on residuals that must be robust against uncertainties or unknown inputs while remaining sensitive to the faults. Two approaches may be applied to design a residual generator (RG): the first one uses the global model of the system and consider the robustness/sensitivity constraints in the RG synthesis. The second one relies on two steps: First, a structural decomposition of the global system is performed with respect to robustness/sensitivity criteria. Second, residuals generators are designed based on the subsystems generated by the previous decomposition. This paper deals with the second approach. The structural decomposition presented here is achieved through special mathematical tools, namely the algebra of functions. These tools are presented and the computational aspects are deeply investigated. An application on an academic example is provided to illustrate the methodology
  • Keywords
    algebra; fault diagnosis; nonlinear systems; algebra of functions; fault detection and isolation; fault detection system design; fault isolation system design; model-based fault detection; model-based fault isolation; nonlinear model decomposition; nonlinear systems; residual generator synthesis; structural decomposition; Algebra; Fault detection; Isolation technology; Nonlinear control systems; Nonlinear systems; Robust control; Robustness; Roentgenium; USA Councils; Uncertainty; Residual generation; algebra of functions; fault detection and isolation; nonlinear systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 2006 45th IEEE Conference on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-0171-2
  • Type

    conf

  • DOI
    10.1109/CDC.2006.377518
  • Filename
    4177169