A data pre-processing method for testability modeling based on first-order dependency integrated model

To improve the operability of testability modeling, a first-order dependency integrated model is proposed. The principle of first-order dependency integrated model is introduced. On the basis of definitions of input port, output port, failure mode and test, definitions of the first-order extended transitive relation of ports, the first-order internal transitive relation of ports, the first-order transitive relation of failure modes and the first-order monitoring relation of tests are proposed. The flow of establishment for first-order dependency integrated model is described in detail. A processor system is taken as an example for application, which shows that this method is feasible and effective.