• DocumentCode
    2471680
  • Title

    Simulation of ultrasonic testing technique by Finite Element Method

  • Author

    Chen, Hanxin ; Sun, Kui ; Ke, Chanli ; Shang, Yunfei

  • Author_Institution
    Sch. of Mech. & Electr. Eng., Wuhan Inst. of Technol., Wuhan, China
  • fYear
    2012
  • fDate
    23-25 May 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Ultrasonic technique is a well-known technique for non-destructive detection of the material defect. In this paper, we develop the ultrasonic model of Finite Element Method (FEM) for the material crack detection in a two-dimensional geometry. The FEM Model is established by the geometry of the defect and the piezoelectric transducers with the finite element analysis software ANSYS. The reflected signals in ultrasonic techniques for the defect were simulated using the plane strain elements. The method with FEM for modeling the time-of-flight diffraction technique (TOFD) for the detection of the thick material (Thickness>;15mm) is proposed, which is based on the diffraction phenomenon. The results from the simulation model are compared to the experimental signal to show the effectiveness of the FEM model.
  • Keywords
    cracks; finite element analysis; materials testing; piezoelectric transducers; ultrasonic applications; 2D geometry; ANSYS software; FEM model; diffraction phenomenon; finite element method; material crack detection; material defect; nondestructive detection; piezoelectric transducer; plane strain element; thick material detection; time-of-flight diffraction technique; ultrasonic testing technique; Analytical models; Computational modeling; Sun; USA Councils; Time-of-flight diffraction (TOFD); finite element method; simulation; ultrasonic testing; wave propagation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Prognostics and System Health Management (PHM), 2012 IEEE Conference on
  • Conference_Location
    Beijing
  • ISSN
    2166-563X
  • Print_ISBN
    978-1-4577-1909-7
  • Electronic_ISBN
    2166-563X
  • Type

    conf

  • DOI
    10.1109/PHM.2012.6228959
  • Filename
    6228959