• DocumentCode
    2472114
  • Title

    Polarization/radiometric based material classification

  • Author

    Wolff, Lawrence B. ; Boult, Terrance E.

  • Author_Institution
    Dept. of Comput. Sci., Columbia Univ., New York, NY, USA
  • fYear
    1989
  • fDate
    4-8 Jun 1989
  • Firstpage
    387
  • Lastpage
    395
  • Abstract
    A technique for identifying the material properties of objects in an image using multiple images taken through a polarizing lens at various rotations in front of a stationary camera (only the filter moves). Using these images, it is possible to obtain the classification of material surfaces at all points on a spectacular highlight. The algorithm is demonstrated on laboratory images. The authors assume a point source, the theory can only be applied at points where specular reflection dominates. Extensions of the theory to deal with extended light sources, which greatly increase the portion of the image giving rise to specular reflection, are also considered
  • Keywords
    light polarisation; light sources; polarimetry; radiometry; extended light sources; material classification; point source; polarizing lens; radiometry; specular reflection; Conducting materials; Dielectric materials; Filters; Inspection; Layout; Lenses; Optical materials; Optical reflection; Polarization; Radiometry;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 1989. Proceedings CVPR '89., IEEE Computer Society Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1063-6919
  • Print_ISBN
    0-8186-1952-x
  • Type

    conf

  • DOI
    10.1109/CVPR.1989.37876
  • Filename
    37876