• DocumentCode
    2473249
  • Title

    Embedded quality analysis platform based on HPI technology

  • Author

    Yao, Yiyong ; Dai, Gang ; Zhao, Liping

  • Author_Institution
    State Key Lab. for Manuf. Syst. Eng., Xian Jiao Tong Univ., Xian
  • fYear
    2008
  • fDate
    25-27 June 2008
  • Firstpage
    5847
  • Lastpage
    5851
  • Abstract
    The embedded quality data acquisition and analysis platform which meets the demand of field real-time quality control against more and more complicated quality control in inter-enterprise is presented in this paper. With HPI technology and regionalization of HPI memory mapping strategy first being adopted in this platform and the accomplishment of HPI driver under Windows CE.net, seamless connection between ARM and DSP is well implemented. Based on event-driven strategy for field quality data real-time acquisition and chain table priority strategy for multi-task scheduling, real-time mixture quality data acquisition and analysis on DSP and the friendly human-interface for real-time display and network data exchange on ARM are realized through HPI technology. System platform for field data dynamic processing and analysis is implemented and improved accordingly.
  • Keywords
    data acquisition; embedded systems; quality control; scheduling; HPI driver; HPI memory mapping; HPI technology; Windows CE.net; chain table priority strategy; embedded quality analysis platform; embedded quality data acquisition; embedded quality data analysis; event-driven strategy; field quality data real-time acquisition; field real-time quality control; multitask scheduling; real-time mixture quality data acquisition; Control systems; Data acquisition; Data analysis; Digital signal processing; Displays; Manufacturing processes; Quality control; Quality management; Real time systems; Signal processing algorithms; Event-driven; Field quality analysis; HPI driver; chain table based on priority;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Control and Automation, 2008. WCICA 2008. 7th World Congress on
  • Conference_Location
    Chongqing
  • Print_ISBN
    978-1-4244-2113-8
  • Electronic_ISBN
    978-1-4244-2114-5
  • Type

    conf

  • DOI
    10.1109/WCICA.2008.4592824
  • Filename
    4592824