DocumentCode
2474157
Title
Nondestructive Observation of Microdefects in In-Doped-GaAs by Photo-Thermal-Radiation Microscope
Author
Mikoshiba, N. ; Tsubouchi, K. ; Akutsu, Y.
fYear
1987
fDate
14-16 Oct. 1987
Firstpage
1183
Lastpage
1186
Keywords
Acoustic beams; Gallium arsenide; Infrared detectors; Microscopy; Radiation detectors; Silicon radiation detectors; Surface emitting lasers; Surface topography; Temperature sensors; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
IEEE 1987 Ultrasonics Symposium
Conference_Location
Denver, Colorado, USA
Type
conf
DOI
10.1109/ULTSYM.1987.199142
Filename
1536082
Link To Document