• DocumentCode
    2474160
  • Title

    Effect of aging of breakdown voltage of artificially damaged cable

  • Author

    Hanson, B.A. ; Reynolds, A.B.

  • Author_Institution
    Dept. of Mech., Aerosp. & Nucl. Eng., Virginia Univ., Charlottesville, VA, USA
  • fYear
    1993
  • fDate
    17-20 Oct 1993
  • Firstpage
    787
  • Lastpage
    792
  • Abstract
    The effect of flaws and thermal and radiation aging of flaws on the electrical breakdown of low-voltage cable was studied. AC breakdown voltages of XLPE (cross-linked polyethylene) and EPR (ethylene-propylene rubber) cables were measured for both damaged and undamaged cable. Three types of flaws were studied: scrapes, transverse cuts, and longitudinal cuts. Some cables were radiated-aged up to 1 MGy and others were thermally aged at 130°C for up to 50 days. Results to date indicate little effect of aging on breakdown voltage and a linear decrease in breakdown voltage with decreasing thickness beneath scrapes and transverse cuts below some threshold thickness. Calculated electric field distributions at breakdown indicate that breakdown occurs by partial discharge in pores
  • Keywords
    XLPE insulation; ageing; electric breakdown; ethylene-propylene rubber; partial discharges; power cable insulation; 130 degC; 50 days; AC breakdown voltages; EPR; XLPE; aging; artificially damaged cable; breakdown voltage; cross-linked polyethylene; electric field distributions; electrical breakdown; ethylene-propylene rubber; flaws; longitudinal cuts; low-voltage cable; partial discharge; pores; radiation aging; scrapes; thermal ageing; threshold thickness; transverse cuts; Aging; Breakdown voltage; Cable insulation; Electric breakdown; Paramagnetic resonance; Partial discharges; Power cables; Radiation safety; Safety devices; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on
  • Conference_Location
    Pocono Manor, PA
  • Print_ISBN
    0-7803-0966-9
  • Type

    conf

  • DOI
    10.1109/CEIDP.1993.378877
  • Filename
    378877