Machine vision inspection of VF display boards

Author

Lu, Yi ; Tisle, A.

Author_Institution

Dept. of Electr. & Comput. Eng., Michigan Univ., Dearborn, MI, USA

Volume

3

fYear

1996

fDate

25-29 Aug 1996

Firstpage

839

Abstract

This paper describes our research in developing computer vision algorithms for inspecting vacuum fluorescent (VF) displaying boards. The entire system consists of two major procedures, learning and inspection. The learning procedure is applied to every new type of VF boards and produces a symbolic list of specification for the inspection procedure. For every VF board on the production line, the inspection procedure will generate pass or fail signal based on the image analysis of various test patterns. At the same time, the inspection procedure also save the image that contains the defect evidence for further verification

Keywords

automatic optical inspection; computer vision; display instrumentation; factory automation; image representation; learning systems; quality control; computer vision; image analysis; learning procedure; machine vision; online inspection; production line; specification list; symbolic representation; test patterns; vacuum fluorescent displaying boards; Computer displays; Computer vision; Fluorescence; Image analysis; Inspection; Machine vision; Production; Signal generators; Test pattern generators; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Pattern Recognition, 1996., Proceedings of the 13th International Conference on

Conference_Location

Vienna

ISSN

1051-4651

Print_ISBN

0-8186-7282-X

Type

conf

DOI

10.1109/ICPR.1996.547286

Filename

547286