• DocumentCode
    2474951
  • Title

    Statistical simulation of SSO noise in multi-gigabit systems

  • Author

    Beyene, Wendemagegnehu T. ; Amirkhany, Amir ; Abbasfar, Ali

  • Author_Institution
    Rambus Inc., Los Altos, CA, USA
  • fYear
    2009
  • fDate
    19-21 Oct. 2009
  • Firstpage
    21
  • Lastpage
    24
  • Abstract
    The use of deterministic techniques to evaluate the impact of simultaneous switching output (SSO) noise on the performance of modern highspeed systems with tight timing budget can be pessimistic. These can lead to conservative design, especially, in multi-gigabit systems with embedded coding or scrambling sublayer. To overcome the shortcomings of conventional methodologies, a statistical simulation method of evaluating the impact of SSO noise on high-speed single-ended signaling systems is presented. The method correctly considers the spatial and temporal distributions of switching activities of devices in the system to calculate the performance degradation of the interface due to power supply noise. First, transient behavior that describes the power supply noise coupling to the signal receiver is generated. Then, using the probability distributions of the switching activities of the drivers, the SSO noise distribution is determined. Finally, this distribution is combined with the channel intersymbol interference (ISI) and device noise and jitter distribution of the signals to calculate the bit error rate (BER) of the overall system.
  • Keywords
    encoding; intersymbol interference; signal processing; statistical analysis; statistical distributions; SSO noise distribution; bit error rate; channel intersymbol interference; deterministic techniques; device noise; embedded coding; high-speed single-ended signaling systems; jitter distribution; multigigabit systems; performance degradation; power supply noise coupling; probability distribution; scrambling sublayer; signal receiver; simultaneous switching output noise; spatial distribution; statistical simulation; switching activities; temporal distribution; tight timing budget; Bit error rate; Communication system signaling; Degradation; Intersymbol interference; Noise generators; Power generation; Power supplies; Probability distribution; Signal generators; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems, 2009. EPEPS '09. IEEE 18th Conference on
  • Conference_Location
    Portland, OR
  • Print_ISBN
    978-1-4244-4447-2
  • Electronic_ISBN
    978-1-4244-5646-8
  • Type

    conf

  • DOI
    10.1109/EPEPS.2009.5338486
  • Filename
    5338486