• DocumentCode
    2475065
  • Title

    Extraction of via and trace model from PCB channel S-parameter data by stochastic optimization

  • Author

    Lee, Juyoung ; Doblar, Drew

  • Author_Institution
    Sun Microsyst. Inc., Santa Clara, CA, USA
  • fYear
    2009
  • fDate
    19-21 Oct. 2009
  • Firstpage
    9
  • Lastpage
    12
  • Abstract
    A new method to extract via and trace model from given S-parameter data of PCB channels with symmetrical ends is presented. By applying stochastic optimization to two channels of different channel lengths, the two-port s-matrix of via and trace can be accurately determined by searching the multi-dimensional parameter space.
  • Keywords
    S-matrix theory; S-parameters; printed circuits; stochastic processes; PCB channel; S-parameter data; multidimensional parameter space; stochastic optimization; trace model; two-port s-matrix; via model; Data mining; Equations; Impedance; Insertion loss; Propagation losses; Scattering parameters; Stochastic processes; Symmetric matrices; Testing; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems, 2009. EPEPS '09. IEEE 18th Conference on
  • Conference_Location
    Portland, OR
  • Print_ISBN
    978-1-4244-4447-2
  • Electronic_ISBN
    978-1-4244-5646-8
  • Type

    conf

  • DOI
    10.1109/EPEPS.2009.5338491
  • Filename
    5338491
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2475065