DocumentCode
2475181
Title
A scalable autotest platform for embedded system
Author
Liu, Di ; Su, Qiao ; Xie, Yan
Author_Institution
Sch. of Comput. Sci. & Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear
2010
fDate
17-19 Dec. 2010
Firstpage
398
Lastpage
401
Abstract
The complex and diversity of embedded system make the developing and testing embedded system a hard work. Providing a high-availability high-scale universal testing platform can improve the development of embedded software. The autotest platform focuses on layered scalability and continuous integration. Loose coupling between the layers makes the system easy to extend at the local layer. Continuous improvements reduce the initial investment, optimize the platform implementation, and expand capacity and capabilities according to requirements. Users commit test requests front-end, and background centralized testing cluster executes this task and returns results to users.
Keywords
automatic test software; embedded systems; background centralized testing cluster; continuous integration; embedded software; embedded system; high-availability high-scale universal testing platform; scalable autotest platform; Embedded systems; Hardware; Monitoring; Schedules; Servers; Testing; Autotest; TDD; black box testing; embedded system;
fLanguage
English
Publisher
ieee
Conference_Titel
Apperceiving Computing and Intelligence Analysis (ICACIA), 2010 International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-8025-8
Type
conf
DOI
10.1109/ICACIA.2010.5709928
Filename
5709928
Link To Document