• DocumentCode
    2475181
  • Title

    A scalable autotest platform for embedded system

  • Author

    Liu, Di ; Su, Qiao ; Xie, Yan

  • Author_Institution
    Sch. of Comput. Sci. & Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2010
  • fDate
    17-19 Dec. 2010
  • Firstpage
    398
  • Lastpage
    401
  • Abstract
    The complex and diversity of embedded system make the developing and testing embedded system a hard work. Providing a high-availability high-scale universal testing platform can improve the development of embedded software. The autotest platform focuses on layered scalability and continuous integration. Loose coupling between the layers makes the system easy to extend at the local layer. Continuous improvements reduce the initial investment, optimize the platform implementation, and expand capacity and capabilities according to requirements. Users commit test requests front-end, and background centralized testing cluster executes this task and returns results to users.
  • Keywords
    automatic test software; embedded systems; background centralized testing cluster; continuous integration; embedded software; embedded system; high-availability high-scale universal testing platform; scalable autotest platform; Embedded systems; Hardware; Monitoring; Schedules; Servers; Testing; Autotest; TDD; black box testing; embedded system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Apperceiving Computing and Intelligence Analysis (ICACIA), 2010 International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-8025-8
  • Type

    conf

  • DOI
    10.1109/ICACIA.2010.5709928
  • Filename
    5709928