• DocumentCode
    2475602
  • Title

    Ethanol gas sensors based on copper phthalocyanine thin-film transistors

  • Author

    Li, Xian ; Jiang, Ya-dong ; Xie, Guang-Zhong ; Du, Xiao-song ; Tai, Hui-Ling ; Yan, Jian-fei ; Fu, Song-Qi

  • Author_Institution
    State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China (UESTC), Chengdu, China
  • fYear
    2010
  • fDate
    17-19 Dec. 2010
  • Firstpage
    470
  • Lastpage
    473
  • Abstract
    A bottom contact copper phthalocyanine (CuPc) based organic thin film transistor (OTFT) was fabricated in this paper. CuPc thin film acting both as gas sensing layer and the active layer was formed by vacuum evaporation and was characterized by scanning electron microscope(SEM). The results show that the film is highly ordered and has a polycrystalline morphology. The current-voltage characteristics of the OTFT were also investigated. The drain-source current in the saturation region would changed when the OTFT was exposed to ethanol vapor compared to that under an exposure to nitrogen gas at room temperature. It is observed that the CuPc based OTFT sensor has high sensitivity and quick response time to ethanol. It indicates that the drain-source current can be considered as a key parameter to monitor chemical species. Such OTFT devices are promising to act as a novel class of chemical sensors.
  • Keywords
    copper compounds; gas sensors; organic compounds; scanning electron microscopy; thin film transistors; OTFT sensor; SEM; chemical sensors; copper phthalocyanine thin film transistors; drain-source current; ethanol gas sensors; nitrogen gas; organic thin film transistor; polycrystalline morphology; scanning electron microscope; temperature 293 K to 298 K; vacuum evaporation; Ethanol; Films; Logic gates; Organic thin film transistors; Temperature sensors; CuPc; gas sensor; organic thin-film transistors (OTFT);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Apperceiving Computing and Intelligence Analysis (ICACIA), 2010 International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-8025-8
  • Type

    conf

  • DOI
    10.1109/ICACIA.2010.5709943
  • Filename
    5709943