• DocumentCode
    2475642
  • Title

    Monte Carlo subspace method: An incremental approach to high-dimensional data classification

  • Author

    Sakai, Tomoya

  • Author_Institution
    Inst. of Media & Inf. Technol., Chiba Univ., Chiba, Japan
  • fYear
    2008
  • fDate
    8-11 Dec. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents the Monte Carlo subspace method - a cost-effective classification technique for high-dimensional data by the Monte Carlo scheme. The most intensive computation in the linear subspace methods is the reduction of dimensionality of the feature space by the eigen decomposition or singular value decomposition. In the present method, the subspaces are learned by updating their orthonormal basis sets with random increment of the dimension of the feature space. The subspace learning progresses with the similarity measurement of test samples until their classification is completed. The expected advantages include reduction of the computational expense without critical loss of recognition rate especially for the high-dimensional data. The performance of the present method was experimentally verified using face recognition datasets.
  • Keywords
    Monte Carlo methods; eigenvalues and eigenfunctions; face recognition; pattern classification; singular value decomposition; Monte Carlo subspace method; computational expense; cost-effective classification technique; data classification; dimensionality reduction; eigen decomposition; face recognition datasets; high-dimensional data; linear subspace methods; orthonormal basis sets; recognition rate; singular value decomposition; Character recognition; Computational efficiency; Extraterrestrial measurements; Face recognition; Information technology; Monte Carlo methods; Optical character recognition software; Singular value decomposition; Space technology; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2008. ICPR 2008. 19th International Conference on
  • Conference_Location
    Tampa, FL
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4244-2174-9
  • Electronic_ISBN
    1051-4651
  • Type

    conf

  • DOI
    10.1109/ICPR.2008.4761129
  • Filename
    4761129