• DocumentCode
    2476622
  • Title

    P1G-5 Ion Beam Sputter-Deposited ZnO Thin Film for Broadband Shear Wave Excitation in the GHz Range

  • Author

    Yanagitani, Takahiko ; Kiuch, Masato

  • Author_Institution
    Tohoku Univ., Sendai
  • fYear
    2007
  • fDate
    28-31 Oct. 2007
  • Firstpage
    1413
  • Lastpage
    1416
  • Abstract
    In-plane and out-of-plane oriented (112macr0) ZnO thin films are attractive for shear wave excitation in the GHz range. It is proposed here that highly oriented and submicron-thick (112macr0) ZnO thin films can be fabricated using ion beam sputter-deposition system with grazing incidence to the substrate surface. This (112macr0) texture formation cannot only be attributed to the well-known ion channeling effect or to the self-shadowing effect since the ion beam incidence direction in the system does not correspond to the ion channeling direction of the ZnO film (the [101macr0] or [112macr0] direction). Full-width-at-half-maximum (FWHM) values of the phi-scan and psi-scan profile curves of the (112macr2) X-ray diffraction poles were measured to be 5deg and 28deg, respectively. A shear-wave transducer with a 0.9-mum-thick film exhibited an untuned one-way conversion loss of less than 20 dB at 1 - 2 GHz and a 3 dB-fractional bandwidth of 100%, without any longitudinal wave excitation.
  • Keywords
    II-VI semiconductors; UHF devices; X-ray diffraction; acoustic transducers; elastic waves; ion beam assisted deposition; piezoelectric thin films; semiconductor thin films; sputter deposition; surface texture; thick films; zinc compounds; X-ray diffraction poles; ZnO; broadband shear wave excitation; frequency 1 GHz to 2 GHz; full-width-at-half-maximum values; in-plane texture formation; ion beam sputter-deposited thin films; ion channeling direction; ion channeling effect; one-way conversion loss; self-shadowing effect; shear-wave transducer; size 0.9 mum; Crystallization; Glass; Ion beams; Piezoelectric films; Radio frequency; Silicon compounds; Sputtering; Substrates; Surface texture; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2007. IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1051-0117
  • Print_ISBN
    978-1-4244-1384-3
  • Electronic_ISBN
    1051-0117
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2007.355
  • Filename
    4409928