DocumentCode
24797
Title
Effects of RF-Bias Power Application in an Inductively Coupled CF4 Plasma on the Nanoscale Morphology and Chemical Bond Structure of Polyethylene Terephthalate Surface
Author
Wan-Soo Kim ; Hee-Woon Cheong ; Wanjae Park ; Ki-Woong Whang
Author_Institution
Dept. of Electr. & Inf. Eng., Seoul Nat. Univ., Seoul, South Korea
Volume
42
Issue
12
fYear
2014
fDate
Dec. 2014
Firstpage
4004
Lastpage
4009
Abstract
By varying the radio frequency-bias power in an inductively coupled CF4 plasma, we have modified the nanoscale morphology and chemical bond structure of polyethylene terephthalate (PET) surface. Specifically, the ion impingement increased the surface roughness and created CFn (n= 2, 3) functional groups on the PET surface, making it hydrophobic. Also observed was a significant increase in the hydrophobicity of the plasma-modified surfaces over the course of several days following the treatment (a hydrophobic recovery). X-ray photoelectron spectroscopy analysis revealed that this spontaneous transformation to a more hydrophobic surface is accompanied by a decrease in the fluoride ion content. The change of plasma density and electron temperature with increasing bias power were discussed. In addition, the change of the ion energy distribution with increasing bias power was investigated.
Keywords
X-ray photoelectron spectra; carbon compounds; high-frequency discharges; hydrophobicity; plasma materials processing; CF2 functional group; CF3 functional group; CF4; RF-bias power application; X-ray photoelectron spectroscopy analysis; chemical bond structure; electron temperature; fluoride ion; hydrophobic PET surface; inductively coupled CF4 plasma; ion energy distribution; nanoscale morphology; plasma density; plasma-modified surface hydrophobicity; polyethylene terephthalate surface; radiofrequency-bias power; surface roughness; Plasmas; Polymers; Positron emission tomography; Rough surfaces; Surface morphology; Surface roughness; Surface treatment; Hydrophobic recovery; X-ray photoelectron spectroscopy (XPS); X-ray photoelectron spectroscopy (XPS).; ion energy distribution (IED); nanoscale morphology; polyethylene terephthalate (PET); radio frequency (RF)-bias power;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2014.2364228
Filename
6945359
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