DocumentCode
2480112
Title
P4G-4 Airborne Ultrasonic Confocal Instrument for Parametric Imaging of Complex Samples
Author
Kananen, V. ; Eskelinen, J. ; Hæggström, E.
Author_Institution
Univ. of Helsinki, Helsinki
fYear
2007
fDate
28-31 Oct. 2007
Firstpage
2058
Lastpage
2060
Abstract
A 680 kHz confocal airborne ultrasonic instrument was built for quantitative material characterization based on parametric imaging. This instrument allows characterization of fragile or moist sensitive samples. Few such instruments are commercially available. The instrument performs simultaneous attenuation and time-of-flight measurements in linear reflection and transmission modes. Sample surface topography is measured in reflection mode and local sample thickness is calculated using the inter-transducer distance. Results for a Pinus Sylvestris test sample are presented. The speed of sound, attenuation, and modulus of elasticity can be mapped locally (local density was measured with X-ray in transmission mode). No repeatable nonlinear sample characteristics were achieved for this sample.
Keywords
atmospheric acoustics; elastic moduli measurement; surface topography measurement; thickness measurement; ultrasonic imaging; ultrasonic materials testing; ultrasonic reflection; ultrasonic transducers; ultrasonic transmission; Pinus Sylvestris test sample; airborne ultrasonic confocal instrument; complex sample imaging; fragile sensitive samples; frequency 680 kHz; inter-transducer distance; linear reflection modes; linear transmission modes; modulus-of-elasticity; moist sensitive samples; parametric imaging; quantitative material characterization; sample surface topography measurement; sample thickness calculation; time-of-flight measurements; Acoustic reflection; Attenuation measurement; Elasticity; Instruments; Performance evaluation; Surface topography; Testing; Thickness measurement; Ultrasonic imaging; Ultrasonic variables measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2007. IEEE
Conference_Location
New York, NY
ISSN
1051-0117
Print_ISBN
978-1-4244-1384-3
Electronic_ISBN
1051-0117
Type
conf
DOI
10.1109/ULTSYM.2007.517
Filename
4410090
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