• DocumentCode
    2480412
  • Title

    P4L-4 Etch Rate Dependence on Crystal Orientation for Lithium Niobate

  • Author

    Randles, Andrew B. ; Tanaka, Shuji ; Esashi, Masayoshi

  • Author_Institution
    Tohoku Univ., Sendai
  • fYear
    2007
  • fDate
    28-31 Oct. 2007
  • Firstpage
    2119
  • Lastpage
    2122
  • Abstract
    This paper presents experimental data for the etch rate of lithium niobate (LiNbO3) as a function of crystal orientation. The etching characterization is a fundamental technology needed for the fabrication of new sensors, actuators or other new devices. In this study, 30 mm spheres of LiNbO3 were etched in hydrofluoric acid and in a solution of hydrofluoric and nitric acids, to determine the etch rate dependence on crystal orientation. It was found that the maximum etch rate was on the -Z face and the etching showed a three-fold symmetry about the Z axis. The Wulff-Jaccodine method as well as the data collected from the etched spheres were used to predict the etched shape of a wafer. The predicted shape agreed with that found during etching.
  • Keywords
    crystal orientation; etching; hydrogen compounds; lithium compounds; surface acoustic wave devices; LiNbO3; Wulff-Jaccodine method; Z axis; actuator fabrication; crystal orientation; etch rate dependence; hydrofluoric acid; lithium niobate; nitric acid; sensor fabrication; three-fold symmetry; wafer; Ferroelectric materials; Lithium niobate; Micromachining; Micromechanical devices; Optical surface waves; Shape; Sputter etching; Surface acoustic waves; Temperature; Wheels;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2007. IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1051-0117
  • Print_ISBN
    978-1-4244-1384-3
  • Electronic_ISBN
    1051-0117
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2007.533
  • Filename
    4410106